Noise in Solid State Devices and CircuitsWiley, 13 mai 1986 - 306 pages Gives basic and up-to-date information about noise sources in electronic devices. Demonstrates how this information can be used to calculate the noise performance, in particular the noise figure, of electronic circuits using these devices. Optimization procedures, both for the circuits and for the devices, are then devised based on these data. Gives an elementary treatment of thermal noise, diffusion noise, and velocity-fluctuation noise, including quantum effects in thermal noise and maser noise. |
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Table des matières
INTRODUCTION | 1 |
MATHEMATICAL METHODS | 7 |
NOISE CHARACTERIZATION | 25 |
Droits d'auteur | |
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Expressions et termes fréquents
1/f noise According amplifier applied assume average base calculate capacitance carriers channel circuit common conductance constant correlated corresponds defined density dependence device diffusion diode discuss distribution drain effect electron emitter energy equation equivalent equivalent circuit evaluate experiment expression factor fluctuating follows frequency function GaAs gain given gives Hence holes IEEE Trans increasing independent injection input integral introduce length low-frequency means measured mixer MOSFET noise figure noise source obtained occur operation output parameter Phys processes prove quantum random recombination region replaced represented resistance saturated semiconductor shot noise shown shows signal Solid spectrum stage temperature term theorem theory thermal noise transistor trap tuned unit van der Ziel varies voltage whereas yields zero Ziel