Statistics in Spectroscopy

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Elsevier, 5 nov. 2003 - 342 pages
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Statistics in Spectroscopy, Second Edition, is an expanded and updated version of the original title. The aim of the book is to bridge the gap between the average chemist/spectroscopist and the study of statistics. The book introduces the novice reader to the ideas and concepts of statistics and uses spectroscopic examples to show how these concepts are applied. Several key statistical concepts are introduced through the use of computer programs.

Serves as a primer for all chemists who
 

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Table des matières

Why This Book?
1
Chapter 2 Important Concepts from Probability Theory
7
The Meaning of Statistics
17
Chapter 4 Degrees of Freedom
25
Chapter 5 Introduction to Distributions and Probability Sampling
35
Chapter 6 The Normal Distribution
47
Chapter 7 Alternative Ways to Calculate Standard Deviation
59
Chapter 8 The Central Limit Theorem
71
Chapter 21 How to Count
175
Chapter 22 And Still Counting
181
Chapter 23 Contingency Tables
187
Random?
195
Chapter 25 The F Statistic
205
Introduction to Analysis of Variance
213
Chapter 27 Analysis of Variance and Statistical Design of Experiments
223
Chapter 28 Crossed and Nested Experiments
233

Chapter 9 Synthesis of Variance
81
Chapter 10 Where Are We and Where Are We Going?
91
Chapter 11 More and Different Statistics
97
Chapter 12 The T Statistic
107
Chapter 13 Distribution of Means
117
Chapter 14 One and TwoTailed Tests
125
Chapter 15 Philosophical Interlude
135
Chapter 16 Biased and Unbiased Estimators
141
Chapter 17 The Variance of Variance
147
Chapter 18 Hypothesis Testing of ChiSquare
155
Chapter 19 More Hypothesis Testing
161
Chapter 20 Statistical Inferences
167
Chapter 29 Miscellaneous Considerations Regarding Analysis of Variance
247
Chapter 30 Pitfalls of Statistics
255
Chapter 31 Pitfalls of Statistics Continued
263
Chapter 32 Calibration in Spectroscopy
271
Linear Regression as a Statistical Technique
279
Error Sources in Calibration
287
Selecting the Calibration Samples
293
Developing the Calibration Model
297
Auxiliary Statistics for the Calibration Model
303
Chapter 38 The Beginning
313
Index
319
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À propos de l'auteur (2003)

Howard Mark is President of Mark Electronics, Suffern, New York. He was previously affiliated as a Senior Scientist at Technicon Instrument Corp. in Tarrytown, New York. He holds a B.S. degree from City College of New York, an M.A. from City University of New York, and a PhD from New York University. His professional interests include instrument development, especially for spectroscopy; statistical and chemometric data analysis; and Custom software development, especially for implementation of data analysis algorithms. He received the 2003 Eastern Analytical Symposium Award for Achievement in Near Infrared Spectroscopy. He holds 6 U.S patents and has published 2 books and numerous book chapters. He has acted as Associate editor for the Handbook of Vibrational Spectroscopy, Wiley (2001). He has served as Past president of Council for Near-Infrared Spectroscopy (CNIRS), Treasurer of the New York section of the Society for Applied Spectroscopy, and as Past Chair of the New York section of the Society for Applied Spectroscopy. In addition he acts as Contributing editor and member of the Editorial Advisory Board of Spectroscopy. He has published over 150 peer-reviewed papers dealing with design and development of scientific instrumentation, new concepts in computerized instrumentation and data analysis.

Jerry Workman, Jr. is Chief Technical Officer and Vice President of Research

& Engineering at Argose Inc., Waltham, MA. In his career, Workman has

focused on molecular and electronic spectroscopy and chemometrics. He has

published over 200 scientific papers, 7 text volumes, and over 20 patents,

patents pending, and trade secrets. He received the B. A. degree in natural

sciences and M. A. degree in biological sciences and genetics from Saint

Mary's University of Minnesota, and the Ph.D. degree in biological chemistry

from Columbia Pacific University. He has completed technical management

certificates from Columbia University and MIT. He is a Fellow of the

American Institute of Chemists, the American Society for Testing and

Materials International, and the Royal Society of Chemistry. In 2002 he was

the recipient of the ASTM International Award of Merit; IBC International

Scientist of the Year; and the Eastern Analytical Symposium Award for

Outstanding Achievements in the Field of Near Infrared Spectroscopy.

Informations bibliographiques